Detecting nanoparticles on production equipment and surfaces

ABSTRACT

Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation application of U.S. application Ser.No. 16/559,074, filed Sep. 3, 2019, which application claims the benefitof priority to U.S. Provisional Patent Application No. 62/726,851 filedSep. 4, 2018, both of which are incorporated herein by reference intheir entireties to the extent not inconsistent herewith.

BACKGROUND OF THE INVENTION

Advancement of the various technologies requiring cleanroommanufacturing has led to a desire for the detection of smaller andsmaller particles. Both microelectronic foundries andpharmaceutical/biological cleanrooms are beginning to seek detection ofparticles less than 20 nm in size as they may affect the increasinglysensitive manufacturing processes.

Smaller particles, specifically particles less than 100 nm, can poseadditional difficulties for maintaining a cleanroom environment becausethey are much more likely to interact or adhere to a surface within thecleanroom environment due to electrostatic, physical, chemical ormagnetic forces between the particle and the surface. At very smallparticle sizes, the mass of the particle is sufficiently low such thatparticle-surface interactions such as electrostatics, hydrogen bonding,Van der Waals forces, chemical adsorption and the like can cause theparticle to stick to the surfaces within the cleanroom environment.

It is often desirable to remove and simultaneously capture and/or detectparticles on surfaces in cleanroom environments. For examples, tools andother devices may need to be removed from the protected environment formaintenance or replacement and need to be checked for nanoscaleparticles before use as the particles may dislodge from surfaces of thetool and interfere with the manufacturing process. Some surfaces may bepermanent fixtures within the cleanroom and need to be periodicallycleaned and scanned for nanoscale particles.

Condensation particle counters and split differential interferometricparticle counters may provide less expensive or more accurate solutionsthan scattered light particle counters. Traditional scattered lightoptical particle counters require exponentially more energy (typicallyprovided in the form of laser) in order to reduce the detectablediameter of particles being analyzed. For example, condensation particlecounters increase the perceived diameter of the particles being analyzedand split differential interferometric detectors manipulate the lasersource into two beams and use interferometry to analyze the interactionof the two beams to reduce the energy required to detect particles at agiven diameter. These techniques dramatically decrease the powerrequired for detection systems, and, therefore, decrease the cost ofparticle detection systems as well as the size of the detector.

Conventional condensation particle counters (also referred to acondensation nuclei counters) allow for the detection of small particlesusing relatively low sensitivity particle counter systems, for exampleoptical particle counters, by increasing detectability of the particleby condensing a vapor into a liquid on the particles' surface,increasing the apparent volume of the particle. Typically, a sample tobe analyzed enters the condensation particle counter system through aflow control device (e.g. a flow orifice) and into a saturator where thesample is mixed with a concentration of condensate primarily in thevapor form. The saturator is in fluid communication with a condensatereservoir which provides condensate to the saturator, where it is heatedto ensure it is sufficiently in the vapor phase. The sample stream, nowmixed with condensate vapor, then flows into a condenser which cools thesample stream, causing the condensate to condense as a liquid aroundparticles contained in the sample stream, thereby enlarging theperceived particle by creating a layer of liquid around the particle.The sample stream is then provided to a particle detection system, suchas an optical particle counter, which more easily detects the particledue to the larger signature caused by the liquid layer. Examples ofcondensation particle counter systems are provided in U.S. Pat. No.5,903,338 and US Patent Pub. No. 2017/0350801, both of which areincorporated by reference in their entirety.

Split differential interferometric optical particle counters split theelectromagnetic radiation into at least two beams. One beam enters thetarget being analyzed (e.g. flow chamber, surface, etc.) and interactswith any particles. The beam is then directed in a way that itintersects and interacts with the second beam. Particles may be detectedby measuring the interference or interaction between the two beams. Thistechnique enhances sensitivity of the particle counter. The increasedsensitivity allows for detection of smaller particles relative to thepower requirement of the optical or laser source, potentially decreasingsize and cost of the particle counter while still allowing for detectionof nanometer scale particles.

It can be seen from the foregoing that there remains a need in the artfor devices and methods capable of the removal of nanoscale particlesfrom surfaces while capturing and analyzing the particles. In somecases, it may be desirable to have lightweight devices capable ofhandheld operation such that they can be used on the various surfaceswithin a cleanroom or sterile environment.

BRIEF SUMMARY OF THE INVENTION

Significant forces may be required to dislodge or remove particles froma surface, including for nanoscale-sized particles (e.g., particleshaving an effective or average diameter less than 1 μm, less than 100nm, or less than 20 nm). A combination of electrostatic, chemical,physical and magnetic forces may be responsible for causing nanoscaleparticles to adhere or stick to various surfaces depending on, amongother things, composition of both the particle and surface, size of theparticle, chemical structure of the particle (e.g. presence of —OHbonds, polarity, electronegativity, etc.) and/or magnetic properties ofboth the particle and surface. The devices and methods described hereinaddress this fundamental problem of measuring surface-adherentparticles, including nanoparticles, by providing any of one or morevarious types of energy or mass that are sufficient to reliably overcomethe attractive forces between the surface and the particles, therebydislodging the particles, and collecting them for accurate and sensitivecharacterization by a particle analyzer, including a particle counter.The devices and methods described herein provide a fundamental platformfor sensitive and reliable detection of surface-adherent particles thatmay otherwise not be detected, which is important in a range ofindustries where such particles can adversely interfere with theunderlying manufacturing process, including for cleanroom applications,such as microelectronic and pharmaceutical manufacture.

Provided herein are devices and methods for the removal and detection ofparticles on a surface, preferably nano-sized particles or“nanoparticles”. Depending on the application of interest, the devicesand methods may be configured to detect particles having acharacteristic size or effective diameter less than 1 μm, preferablyless than 100 nm, or more preferably less than 20 nm. Similarly, thedevices and methods are compatible with any of a range of surface typesand compositions, depending on the application of interest, including asurface associated with production equipment and/or a facility surface.

Provided herein are devices comprising a particle analyzer, such as aparticle counter, that is operably connected to a probe unit that iscapable of both dislodging particles from a surface and sampling theparticles after they have been dislodged from the surface. The devicesand methods described herein are preferably lightweight and/or handheld,for example, so that they may be used within a cleanroom environment toclean and sample permanent surfaces and tools in a mobile manner, wherea user can readily move the probe to the desired surface. The describeddevices are compatible with non-optical and with optical particlecounters. Representative non-optical particle counters include particledetection by non-optical means such as ultrasonic, electrochemical,single particle inductively coupled plasma mass spectrometry (ICP/MS),electrical (resistance and/or capacitance signals generated by particlespassing an energized orifice, such as a Coulter counter), and the like.

Optical particle counters use scattered, obscured or emitted light todetect particles. The optical particle counter may utilize condensationparticle counting systems or split detection optical particle countersto increase the sensitivity of the device (thereby allowing for thedetection of smaller particles) while avoiding the increased complexitytypically required for the detection of nanoscale particles, e.g.,particles less than 100 nm in effective diameter.

The use of condensation particle counters for the application of surfaceremoval and detection may be advantageous over other types of particlecounters or analyzers (e.g. scattered or obscured light detectors) dueto the lower power requirements provided by condensation particlecounters. While condensation particle counters may use a similar form oflight detection (e.g. scattered, obscured), the ability of thecondensation aspect of the particle counter to increase the effectivesize (i.e. effective diameter, volume) of the particles by condensing aliquid on the surface of the particle means that the detection systemneeds only be capable of detecting an enlarged particle. For example, ascattered light optical particle counter would require orders ofmagnitude increases in the optical power source (e.g. laser) to detect a10 nm particle than a condensation particle counter that could enlargethe effective diameter of the 10 nm particle to approximately 300 nm to500 nm. This increased power requirement for the optical (typicallylaser) detector dramatically increases cost, size and frailty of theoverall system, making design of handheld, lightweight high-sensitivitytraditional particle counters problematic. This is one reason why it ispreferable that the particle analyzer is a condensation particlecounter, preferably an optical condensation particle counter.

Split detector particle counters may also be useful in decreasing theamount of laser energy required to detect particles in the nanometerrange, for example, from 5 nm to 100 nm. By measuring the differentialof the split beams of the laser source, the effectiveness andsensitivity of the optical particle counter may be increased relative todirectly measuring the emitted or scattered light of a traditionalparticle counter.

Provided herein are devices for removal and detection of particles on asurface comprising: i) a particle analyzer, such as a particle counter,having an inlet; ii) a sample probe having a sampling port, wherein thesampling port is fluidically connected to the inlet of the condensationparticle counter by a flow path; iii) an ejection system operablyconnected to the sample probe, wherein the ejection system is configuredto direct matter, energy or a combination thereof onto the surface todislodge the particles from the surface; and iv) a vacuum systemoperably connected to the sampling port such that the vacuum system isconfigured to force dislodged particles proximate to the sample probethrough the sampling port, along the flow path and into the particlecounter via the flow path.

“Proximate” refers to those particles that are in the vicinity of (e.g.,adjacent to) the sample probe, such as particles dislodged that areimmediately below the sample probe and positioned between the surfaceand the sample probe and is also referred herein as a “collectionregion”. Of course, depending on the magnitude of the force acting tocollect the dislodged particles, proximate can encompass some areaaround and adjacent to the sample probe, such as the area correspondingto the contact area of a housing surface that contains the sample probe,port and ejection system and that is immediately below the housingsurface that faces the corresponding surface, and a small outerperimeter area thereof, such as less than 1 cm, less than 1 mm or lessthan 1 μm. This surrounding area of the proximate region may be small tominimize collection of unwanted particles outside the collection region(e.g., minimize counting particles in surrounding air and insteadcollects particles dislodged from the surface), but can be relativelylarger for applications where the sample probe is being moved relativelyquickly over the surface. The collection region proximate to the sampleprobe can be user-adjustable, such as by adjusting the vacuum power, andthereby increasing the collection region proximate to the sample probe,or reducing the vacuum power, thereby decreasing the size of thecollection region. Similarly, the speed and distance from the surfacethat the probe is positioned will also influence collection region sizeand geometry. Slow and steady probe motion over a surface provides arelatively uniform collection region proximate to the sample probe thatremains relatively constant over time and surface position.

The particle analyzer may be a particle counter, including an opticalparticle counter, preferably a condensation particle counter. Thecondensation particle counter inlet may introduce a sample streamcontaining the dislodged particles to be analyzed, and may, for example,comprise: a condensate reservoir; a saturator in fluid communicationwith the condensate reservoir for introducing a condensate into thesample stream; a condenser in fluid communication with the saturator forcondensing the condensate onto the dislodged particles contained in thesample stream; and wherein the particle counter inlet is in fluidcommunication with the condenser for detecting or characterizing thecondensed dislodged particles in the sample stream.

The particle counter systems described herein may use a condensate ofwater, methanol, ethanol, propanol, butanol, glycerol, ethylene glycol,diethelyene glycol, propylene glycol, or a combination thereof. Thedevices may detect particles having an effective diameter of less thanor equal to 250 nm, less than or equal to 100 nm, or optionally, lessthan or equal to 50 nm. The devices may dislodge and detect particlesselected from the range of 5 nm to 100 nm. The devices may be portable,for example, weighing less than 30 kg, 20 kg, or optionally, less than10 kg while being in an operable condition, thereby allowing a user tomove the device at-will without need for additional assistance.

The devices described herein may use a split differentialinterferometric optical particle counter. The particle counter may beconfigured such that the ejection system dislodges and the splitdifferential interferometric optical particle counter detects particlesselected from the range of 5 nm to 100 nm. The split differentialinterferometric optical particle counter may use a Gaussian or anon-Gaussian beam as an optical source.

The optical particle counter may be configured for differential opticaldetection. The differential optical detection may utilize a plurality ofoptical detectors each spatially mapped to different portions of anoptical beam that interacts with the particle. At least a portion of theoptical beam may be passed through a flow cell containing the particlesand directed onto the plurality of optical detectors. The opticaldetectors may be each spatially mapped to portions of the optical beamthat are not overlapping. The optical detectors may be configured fordifferential detection. The optical detectors may be configured forsplit beam detection differential detection. The optical beam may be aGaussian beam, a non-Gaussian beam, a structured beam or aninterferometric beam.

The ejection system is compatible with a range of ejection materials,and may direct energized matter to the surface. Energized matter asdescribed herein may be selected from the group consisting of:compressed gas, ionized gas, pulsed gas, ultrasonic gas, megasonic gas,cryogenic gas, carbon dioxide snow and any combination thereof.Energized matter may comprise air, carbon dioxide, argon, nitrogen orany combination thereof. The ejection system may provide ultrasonic ormegasonic energy to the surface. The ejection system may thermallyexcite the particles on the surface. The ejection system may alter theelectrical charge of the particles (e.g. by providing ions) to thesurface. The ejection system may eject atmospheric pressure plasma,which may be an air plasma or an Argon plasma (larger atom, greatermomentum transfer for removing nanoparticles from surface), in thedevices and methods for removing nanoparticles from surfaces.

The ejection system may pulse energy, matter or a combination thereof tofacilitate the removal of particles from the surface. The ejectionsystem may use a pulsed liquid and the optical particle counter may be aliquid optical particle counter. The pulsed liquid may include one ormore surfactants. Representative surfactants include, but are notlimited to, ionic, non-ionic and/or anionic surfactants, such asPolysorbate (such as polyoxyethylene-sorbitan-20 mono-oleate) and/orsodium dodecyl sulfate (SDS).

The probe as described herein may be handheld or machine controlled andmay be connected to the inlet by a flexible hose or tube. As known inthe art, the flexible hose or tube are configured to ensure there isminimal particle interaction with the wall. For example, the hose ortube wall may be configured to be static-free, such as formed of anelectrically conductive material, thereby minimizing risk of dislodgedparticles interacting with the wall and attendant potentialundercounting. For portable manual handheld devices, the particlecounter component portion may be lifted with one hand, and the probeportion controlled by the other hand and moved over the surface by hand.In this manner, it is preferable that the ejection system is integratedwith the probe portion.

Any of the devices described herein may be used in various methods,including for methods for removing and characterizing nanoparticles on asurface. A method for removing and characterizing particles on a surfacemay comprise: directing matter, energy or a combination thereof at thesurface to dislodge nanoparticles from the surface; vacuuming thedislodged particles through a sample probe and into an inlet of aparticle analyzer or counter; and characterizing the particles with theparticle analyzer or counter.

Another method for removing and characterizing particles on a surfacemay comprise the steps of: providing a device comprising: a condensationparticle counter having an inlet; a sample probe having a sampling port,wherein the sampling port is fluidically connected to the inlet of thecondensation particle counter by a flow path; an ejection systemoperably connected to the sampling probe, wherein the ejection systemdirects matter, energy or a combination thereof onto the surface todislodge the particles from the surface; and a vacuum system operablyconnected to the sampling port such that the vacuum system forcesparticles proximate to the sample probe through the sampling port andinto the condensation particle counter via the flow path. The method mayfurther comprise directing matter, energy or a combination thereof atthe surface from the ejection system to thereby dislodge particles fromthe surface; vacuuming the dislodged particles through the sample portin the sample probe and into a condensation particle counter via theflow path; and characterizing the particles using the condensationparticle counter.

Characterizing the particles may comprise detecting or counting theparticles. The detecting or characterizing may correspond to providing aparticle present or absence condition; number of particles per unitsurface area or particle concentration on the surface (e.g., number ofparticles/area such as mm², cm², etc.); a total number of particles onthe surface; total number of particles on a tool; a particle size;particle size range(s); and any combination thereof, such as number ofparticles in selected size bins, for example, less than 5 nm, between 5nm and 20 nm, between 20 and 50 nm, between 50 nm and 100 nm, andgreater than 100 nm, etc; particle cleaning efficacy such as a measureof percent extraction from the cleaning process (total particles aftercleaning)/(total particles before cleaning) such that lower percentagesreflect better cleaning than relatively higher percentages or anyfunctionally equivalent measure; histogram of particle sizes; and anycombination thereof.

A condensation particle counter may comprise: i) an inlet forintroducing a sample stream to be analyzed; ii) a saturator forintroducing a condensate into the sample stream; wherein the saturatoris in fluid communication with a condensate reservoir; iii) a condenserin fluid communication with the saturator for condensing the condensateonto particles contained in the sample stream; and iv) a particlecounter in fluid communication with the condenser for detecting orcharacterizing the particles in the sample stream.

Ejecting or dislodging the particles from the surface may include:directing a fluid at the surface; directing energy at the surface;directing carbon dioxide snow at the surface; directing ultrasonic ormegasonic energy at the surface or thermally exciting particles on thesurface. The fluid may comprise air, carbon dioxide, argon, nitrogen orany combination thereof. Directing the fluid at the surface may include:pulsing the fluid; energizing the fluid; ionizing the fluid; orproviding the fluid at a cryogenic temperature. Directing energy at thesurface may use energy that is provided at an ultrasonic or a megasonicfrequency.

Without wishing to be bound by any particular theory, there may bediscussion herein of beliefs or understandings of underlying principlesrelating to the devices and methods disclosed herein. It is recognizedthat regardless of the ultimate correctness of any mechanisticexplanation or hypothesis, an embodiment of the invention cannonetheless be operative and useful.

DESCRIPTION OF THE FIGURES

FIG. 1 is a schematic illustration of a device for removal and detectionof particles on a surface

FIG. 2 is a schematic illustration of a condensation particle counter.

FIG. 3 is a schematic illustration of an optical particle counter.

FIG. 4 is a schematic illustration of a machine controlled sample probe,such as on an x-y translation frame.

DETAILED DESCRIPTION OF THE INVENTION

In general, the terms and phrases used herein have their art-recognizedmeaning, which can be found by reference to standard texts, journalreferences and contexts known to those skilled in the art. The followingdefinitions are provided to clarify their specific use in the context ofthe invention.

“Particle analyzer” is used broadly herein to refer to an instrumentthat provides a useful particle parameter. Examples include, but are notlimited to coulter counters, mass spectrometers, microscopic detection,flow cytometry, laser diffraction, dynamic light scattering,sedimentation, impactors, preferably particle counters, and morepreferably optical particle counters.

“Optical particle counter,” as used herein, refers to any device thatuses optical detection to detect, count or characterize particles,typically by analyzing a surface or a fluid flow chamber. Opticalparticle counters provide a beam of electromagnetic radiation (such asby a laser) into the analysis area, where the beam interacts with anyparticles and then detects the particles based on changes to the beam.Detection may focus on electromagnetic radiation that is scattered,obscured or emitted by the particles. Various detectors for opticalparticle counters are known in the art, including for example, singledetection systems, detector arrays, cameras, various detectororientations, etc. Optical particle counter includes condensationparticle counters, condensation nuclei counters, split beam differentialsystems and the like. When used in the context of a condensationparticle counter, the particle counter portion refers to the detectionsystem (e.g. source of electromagnetic radiation, optics, filters,optical collection, detector, processor, etc.). “Non-optical” particlecounters refers to a device that uses non-optical means, such aselectrical, electrochemical, mass spectrometry and the like.

“Condensation particle counter” is used synonymously with condensationnuclei counter and refers to a particle detector or analyzer thatdeposits a fluid on the surface of the particles prior to detection toincrease their effective size in order to detect particles smaller thanwould otherwise be detectable by the detection system. Examplecondensation particle counters are described in U.S. Pat. No. 5,903,338and US Patent Pub. No. 2017/0350801, each of which are incorporated byreference in their entirety. Condensation particle counters may useoptical detection systems, including scattered light detection systems.Various scattered light detection systems and improvement are known inthe art.

“Ejection system” refers to a system for the removal, dislodging orforcing airborne particles or nanoparticles that are on a surface,including strongly or weakly adhered to the surface. The ejection systemmay provide mass or energy to overcome the forces (electrostatic,chemical, magnetic, etc.) which may cause small particles to stick oradhere to a surface. The ejection system may be operably connected to asample probe, for example, a handheld puck or wand. The ejection systemis compatible with any number of means for reliably dislodgingsurface-adherent particles, such as compressed gas, ionized gas, pulsedgas, megasonic gas, cryogenic gas, carbon dioxide snow, atmosphericpressure plasma (e.g., air plasma or argon plasma), and/or othermaterials to remove particles from a surface. The ejection system mayprovide ultrasonic or megasonic energy. The ejection system may alsointeract with the individual particles, for example, by providingthermal energy or changing the charge state of the particle. “Dislodge”refers to the application of the ejection system to sufficientlyovercome the adhesive particle-surface interaction such that theparticle is collected, including by the vacuum system. Accordingly, theejection system is configured to specially dislodge particles in areliable manner such that they are collected by the vacuum system, butnot at such a large ejection velocity or dislodgment position that wouldrisk overcoming the collection force generated by the vacuum system.

“Vacuum system” refers to a system for collecting particles after theyhave been ejected or dislodged from a surface and providing them to thecondensation particle counter for detection or analysis. The vacuumsystem may be analogous to the ejection system (e.g. using the sameprocess such as ionized gas) or it may be different. The vacuum systemmay be a compressed air suction system. The vacuum system may beoperably connected to a sample probe, for example, the same probe as theejection system or a different probe positioned to enhanced collectionafter ejection from the surface. The vacuum system may connect to ahouse line or may be portable, such as a portable vacuum pump.

“Operably connected” refers to a configuration of elements, wherein anaction or reaction of one element affects another element, but in amanner that preserves each element's functionality. For example, anejection system operably connected to the sample probe refers toattachment or integration such that the ejection system reliablydislodges particles from a surface that can be collected by the sampleprobe and provided to the particle analyzer inlet. Similarly,“fluidically connected” refers to a configuration of elements such thatthe elements are in fluid communication. For example, a sampling portfluidically connected to the inlet refers to a fluid, specificallydislodged particles suspended in a fluid such as air or a liquid, thatis capable of flowing from the sampling port to the inlet.

“Split differential interferometric particle counter” or “splitdifferential particle counter” refers to an optical particle counterthat uses a differential measurement of multiple beams ofelectromagnetic radiation to increase the sensitivity of the particlecounter over optical particle counter systems that directly detectelectromagnetic radiation scattered, obscured or emitted by theparticles. In some embodiments interferometry refers to the interactionof two beams. In these embodiments, a beam from an optical source issplit into two or more separate beams. One beam interacts with the flowchamber or surface being analyzed for particles, then is directed backinto the second beam. In some cases the two beams interact at the pointof measurement (e.g. flow chamber, surface). The differential generatedby the interaction between the two beams can be analyzed viainterferometry to detect or characterize particles that interacted withthe first beam. In some embodiments interferometry refers todifferentially analyzing two or more detectors. For example, two or moredetectors may be placed along the fluid flow path. By comparing thedifferential of the two detectors, a significant portion of the lasernoise may be canceled. Representative examples include, but are notlimited to, U.S. Pat. No. 7,746,469, U.S. Pub. Nos. 2015/0260628,2017/0176312 and U.S. Pat. App. No. 62/838,835 filed Apr. 25, 2019titled “Improved particle detection systems and methods” (Atty Ref.337422: 82-19P US). Each of these references are hereby incorporated intheir entirety and specifically to illustrate particle counter systemcomponents and configurations that are useful for the detection of smallparticles.

Split differential interferometric particle counters may use Gaussian ornon-Gaussian beams. Interferometric methods are known in the art, forexample, as described in U.S. Pat. No. 7,528,959, US Patent Publications2007/0030492 and 2009/0323061, Bouhelier, Phys. Review Letters, 90:1 &Goldberg, IEEE Jour. of Selected Topics in Quantum Electronics, 8:5,1051-1059; Bouhelier et al. Applied Physics Letters, Vol. 82, No. 25,pp. 4596-4598, Jun. 23, 2003; Ignatovich, PRL 96, 013901 (2006), each ofwhich is incorporated by reference in their entirety

“Non-Gaussian Beam” refers to a beam of electromagnetic radiation (e.g.a laser) that has been modified such that the beam profile has anon-Gaussian distribution. Non-Gaussian beams be generated by techniquesknown in the art including modification of the laser cavity, combinationof multiple beams into a single beam profile, spatial filters and thelike.

The following examples further illustrate the invention but, of course,should not be construed as in any way limiting its scope.

Example 1

This example demonstrates a condensation particle counter with anattached ejection and sampling device (e.g. a sample puck or wand).

Described herein are systems and methods for monitoring of particlesadhering to surfaces by adapting a condensation particle counter with asample puck. The device generates a metered flow of filtered clean airand delivers it to the sample puck for dislodging particles from asurface. The resultant air stream with dislodged particles is thenpulled from the sample puck into the condensation particle counter witha vacuum system. The vacuum system may utilize a matching flow rate tothe dislodging flow rate. As particle size reduces, electrostatic andstiction characteristics make the particles progressively harder toeject from the surface for potential collection and counting. Moreaggressive particle removal techniques may be used to effectively removethem from surfaces. Some example removal techniques include: Metered airflow; Thermal excitation; Atmospheric ionization; Pulsed air flow;Ultra-sonic and megasonic pulsations; Metered fluid sprays with samplepre-conditioning; Supersonic CO₂ snow; Use of Ar or N₂ or a blend ofcryogenic aerosol jet cleaning; Pulsed liquids, including use ofsurfactants

Additionally, the sample probe may be configured as a sample puckspecifically designed to reach difficult tool surface locations or otherchallenges. The sample puck and injection system may also be metered,for example, configured to measure volumetric or mass flow rate into orout of the system.

Referring to FIG. 1, a particle analyzer 10 has an inlet 20 forreceiving a fluid sample that may contain particles 3 dislodged from asurface 5. A sample probe 30 is illustrated as a puck geometry, but canhave any of a number of shapes depending on the application of interest,including a wand geometry, curved geometry, such as convex and/orconcave, or combinations thereof. For example, the shape of the surfaceof the probe housing 80 may complement the shape of the surface 5 thatthe probe interacts with or be configured to be comfortably hand-held.The sample probe 30 has a sampling port 40 that is fluidically connectedvia a flow path 50 (e.g., tube or conduit) to the particle analyzerinlet 20. An ejection system 60 is operably connected to the sampleprobe 30, such as incorporated therein as shown. Alternatively, theejection system 60 may be mounted or otherwise connected sample probe 30so that movement of probe 30 provides a corresponding movement ofejection system 60, so that particle dislodged from surface 5 byejection system 60 are collected by a vacuum system 70 in the collectionregion 35 proximate to the sample probe 30, as indicated by dashedregion 35 of FIG. 1. For example, a surface of probe housing 80 may beconcave with an outer perimeter raised to form a collection region thatcorresponds to a volume within the housing, where the vacuum actiongenerated by vacuum 70 may be enhanced to ensure dislodged particlecollection in region 35. As desired, various ports or openings in thehousing 80 may ensure that the ejection system is able to interact withsurface 5 and the collection means, such as vacuum 70, collectsparticles dislodged from surface 5, while minimizing risk of particlesin the surrounding environment being collected and/or to avoid unwantedphysical contact between housing 80 and surface 5.

Vacuum 70 may be an internally positioned pump or can be an externallypositioned pump, such as via a vacuum line connected to house vacuum. Asdesired, the output air may be recirculated, such as air from the pump70 that is filtered to remove particles and sent to the probe to provideanother means of dislodging and/or facilitating particle collection,including by forming a type of air cushion between probe 30 and surface5 to reduce unwanted physical contact between housing 80 and surface 5.

Probe housing 80 may be configured to be held by hand or may becontrolled via machine 400 for automated movement that is machinecontrolled (FIG. 4). Sample probe can be in a puck configuration.Preferably, there is no or little physical contact between the sampleprobe and the surface, thereby minimizing risk of unwanted frictiongenerating particles that may be inadvertently collected and detected asa contaminant particle. Clean air may be supplied around the outer edgeso that the probe functionally rides on an air cushion between thesurface and the probe housing, thereby avoiding or at leastsignificantly reducing friction. The air may be recirculated filteredair output from the vacuum 70.

FIG. 2 illustrates a condensation particle counter with saturator 200 influid communication with condensate reservoir 210 for introducingcondensate 215 into sample stream 230. Condenser 220 condenses thecondensate 215 onto particles in the sample stream 230 and the samplestream with condensate on particles is introduced to the particleanalyzer or counter 10. Vacuum system 70 may drive fluid stream throughthe particle analyzer or counter 10.

FIG. 3 schematically illustrates various components of an opticalparticle counter. An optical source such as a laser 300 generates anoptical beam 301 that optically interacts with focusing optics 305before passing to fluid stream flow 230 in flow cell 310. Output opticalbeam 302 that has optically interacted with fluid stream 230 in flowcell 310 then optically interacts with collecting optics 320 thatensures the output beam 302 is directed onto a plurality of opticaldetectors 330 (illustrated as D1 and D2, but can vary from between 1-500pairs for differential detection). The resultant signal for a split beamdetection is the differential detection between D2 and D1.

FIG. 4 illustrates a sample probe 30 with ejection system connected to amachine controller 400, illustrated as an x-y translation stagecontrolled by stepper motors. In this manner, coverage of a surface areaof surface 5 can be automatically and reliably controlled, with flowpath 50 providing surface 5 dislodged particles to particle counter 10.

STATEMENTS REGARDING INCORPORATION BY REFERENCE AND VARIATIONS

All references, including publications, patent applications, andpatents, cited herein are hereby incorporated by reference to the sameextent as if each reference were individually and specifically indicatedto be incorporated by reference and were set forth in its entiretyherein.

All references throughout this application, for example patent documentsincluding issued or granted patents or equivalents; patent applicationpublications; and non-patent literature documents or other sourcematerial; are hereby incorporated by reference herein in theirentireties, as though individually incorporated by reference, to theextent each reference is at least partially not inconsistent with thedisclosure in this application (for example, a reference that ispartially inconsistent is incorporated by reference except for thepartially inconsistent portion of the reference).

The terms and expressions which have been employed herein are used asterms of description and not of limitation, and there is no intention inthe use of such terms and expressions of excluding any equivalents ofthe features shown and described or portions thereof, but it isrecognized that various modifications are possible within the scope ofthe invention claimed. Thus, it should be understood that although thepresent invention has been specifically disclosed by preferredembodiments, exemplary embodiments and optional features, modificationand variation of the concepts herein disclosed may be resorted to bythose skilled in the art, and that such modifications and variations areconsidered to be within the scope of this invention as defined by theappended claims. The specific embodiments provided herein are examplesof useful embodiments of the present invention and it will be apparentto one skilled in the art that the present invention may be carried outusing a large number of variations of the devices, device components,methods steps set forth in the present description. As will be obviousto one of skill in the art, methods and devices useful for the presentmethods can include a large number of optional composition andprocessing elements and steps.

When a group of substituents is disclosed herein, it is understood thatall individual members of that group and all subgroups are disclosedseparately. When a Markush group or other grouping is used herein, allindividual members of the group and all combinations and subcombinationspossible of the group are intended to be individually included in thedisclosure.

Every formulation or combination of components described or exemplifiedherein can be used to practice the invention, unless otherwise stated.

Whenever a range is given in the specification, for example, atemperature range, a time range, or a composition or concentrationrange, all intermediate ranges and subranges, as well as all individualvalues included in the ranges given are intended to be included in thedisclosure. It will be understood that any subranges or individualvalues in a range or subrange that are included in the descriptionherein can be excluded from the claims herein.

All patents and publications mentioned in the specification areindicative of the levels of skill of those skilled in the art to whichthe invention pertains. References cited herein are incorporated byreference herein in their entirety to indicate the state of the art asof their publication or filing date and it is intended that thisinformation can be employed herein, if needed, to exclude specificembodiments that are in the prior art. For example, when composition ofmatter are claimed, it should be understood that compounds known andavailable in the art prior to Applicant's invention, including compoundsfor which an enabling disclosure is provided in the references citedherein, are not intended to be included in the composition of matterclaims herein.

As used herein, “comprising” is synonymous with “including,”“containing,” or “characterized by,” and is inclusive or open-ended anddoes not exclude additional, unrecited elements or method steps. As usedherein, “consisting of” excludes any element, step, or ingredient notspecified in the claim element. As used herein, “consisting essentiallyof” does not exclude materials or steps that do not materially affectthe basic and novel characteristics of the claim. In each instanceherein any of the terms “comprising”, “consisting essentially of” and“consisting of” may be replaced with either of the other two terms. Theinvention illustratively described herein suitably may be practiced inthe absence of any element or elements, limitation or limitations whichis not specifically disclosed herein.

One of ordinary skill in the art will appreciate that startingmaterials, biological materials, reagents, synthetic methods,purification methods, analytical methods, assay methods, and biologicalmethods other than those specifically exemplified can be employed in thepractice of the invention without resort to undue experimentation. Allart-known functional equivalents, of any such materials and methods areintended to be included in this invention. The terms and expressionswhich have been employed are used as terms of description and not oflimitation, and there is no intention that in the use of such terms andexpressions of excluding any equivalents of the features shown anddescribed or portions thereof, but it is recognized that variousmodifications are possible within the scope of the invention claimed.Thus, it should be understood that although the present invention hasbeen specifically disclosed by preferred embodiments and optionalfeatures, modification and variation of the concepts herein disclosedmay be resorted to by those skilled in the art, and that suchmodifications and variations are considered to be within the scope ofthis invention as defined by the appended claims.

We claim: 1.-40. (canceled)
 41. A device for dislodging particles from asurface and detecting said dislodged particles, the device comprising: aparticle analyzer comprising an inlet, an electromagnetic radiationsource configured to interact with said dislodged particles, and anelectromagnetic radiation detector configured to detect electromagneticradiation emitted from said dislodged particles; a sample probe having asampling port, wherein said sampling port is fluidically connected tosaid inlet by a flow path; an ejection system operably connected to saidsample probe, wherein said ejection system is configured to directmatter, energy or a combination of matter and energy onto said surfaceto dislodge said particles from said surface; and a vacuum systemoperably connected to said sampling port, wherein said vacuum system isconfigured to force said dislodged particles in a collection regionproximate to said sample probe through said sampling port, along saidflow path and into said particle analyzer at said inlet for real-timedetection of said dislodged particles.
 42. The device of claim 41,wherein said particle analyzer comprises a particle counter.
 43. Thedevice of claim 42, wherein said particle analyzer comprises an opticalparticle counter.
 44. The device of claim 42, wherein said particlecounter uses emitted light to detect, count or characterize saiddislodged particles.
 45. The device of claim 41, wherein saidelectromagnetic radiation source provides a beam of a firstelectromagnetic radiation that interacts with said dislodged particlesduring said real-time detection.
 46. The device of claim 45, whereinsaid electromagnetic radiation detector detects a second electromagneticradiation emitted by said dislodged particles during said real-timedetection.
 47. The device of claim 46, wherein, during said real-timedetection: said electromagnetic radiation source provides a beam of afirst electromagnetic radiation that interacts with said dislodgedparticles, thereby causing said dislodged particles to emit a secondelectromagnetic radiation, and said electromagnetic radiation detectordetects said second electromagnetic radiation emitted by said dislodgedparticles.
 48. The device claim 41, wherein said particle analyzerfurther comprises a differential optical detector comprising: aplurality of optical detectors each spatially mapped to differentportions of an optical beam that interacts with said dislodged particlesin said particle analyzer.
 49. The device of claim 48, wherein at leasta portion of said optical beam is passed through a flow cell containingsaid dislodged particles and directed onto said plurality of opticaldetectors.
 50. The device of claim 49, wherein said optical detectorsare each spatially mapped to portions of said optical beam that are notoverlapping.
 51. The device of claim 49, wherein said optical detectorsare configured for differential detection.
 52. The device of claim 49,wherein said optical detectors are configured for split beam detectiondifferential detection.
 53. The device of claim 49, wherein said opticalbeam is selected from the group consisting of: a Gaussian beam, anon-Gaussian beam, a structured beam, and an interferometric beam. 54.The device of claim 41, wherein said ejection system directs energizedmatter to said surface.
 55. The device of claim 54, wherein saidenergized matter is selected from the group consisting of: compressedgas, ionized gas, pulsed gas, ultrasonic gas, megasonic gas, cryogenicgas, carbon dioxide snow, atmospheric pressure plasma, and anycombination thereof.
 56. The device of claim 54, wherein said energizedmatter comprises: air, carbon dioxide, argon, nitrogen or anycombination thereof.
 57. The device of claim 41, wherein said ejectionsystem is configured to direct ultrasonic or megasonic energy to saidsurface.
 58. The device of claim 41, wherein said ejection system isconfigured to thermally excite particles on said surface.
 59. The deviceof claim 41, wherein said ejection system is configured to apply pulsesof said energy, matter or said combination thereof.
 60. The device ofclaim 41, wherein said ejection system is configured to apply a pulsedliquid and said particle analyzer is a liquid optical particle counter.61. The device of claim 60, wherein said pulsed liquid comprises one ormore surfactants.
 62. The device of claim 41, wherein said device isportable with a total mass less than 20 kg.
 63. The device of claim 41,wherein said sample probe comprises a housing configured to be held andmoved by a user hand.
 64. The device of claim 41, further comprising amachine controller connected to said sample probe for automaticpositioning and movement of said sample probe relative to said surface.65. The device of claim 41, further comprising a flexible hose or tubethat fluidically connects said sample probe to said inlet.
 66. Thedevice of claim 41, wherein at least a portion of said dislodgedparticles comprise nanoparticles.
 67. The device of claim 41, wherein atleast a portion of said dislodged particles have an effective diameterless than or equal to 100 nm.
 68. A method for removing particles from asurface and characterizing said removed particles, the methodcomprising: directing matter, energy or a combination thereof at saidsurface to dislodge particles from said surface; vacuuming saiddislodged particles through a sample probe and into an inlet of aparticle analyzer; characterizing said dislodged particles with saidparticle analyzer, thereby providing real-time detection of thedislodged particles, wherein said characterizing comprises: interactinga beam of a first electromagnetic radiation with said dislodgedparticles, thereby causing said dislodged particles to emit a secondelectromagnetic radiation, and detecting said second electromagneticradiation emitted from said dislodged particles.
 69. A method fordislodging particles from a surface and characterizing said dislodgedparticles, the method comprising: providing a device comprising: aparticle analyzer comprising an inlet, a condensation particle counter,an electromagnetic radiation source configured to interact with saiddislodged particles, and an electromagnetic radiation detectorconfigured to detect electromagnetic radiation emitted from saiddislodged particles; a sample probe having a sampling port, wherein saidsampling port is fluidically connected to said inlet of said particleanalyzer by a flow path; an ejection system operably connected to saidsampling probe, wherein said ejection system directs matter, energy or acombination thereof onto said surface to dislodge said particles fromsaid surface; a vacuum system operably connected to said sampling portsuch that said vacuum system forces said dislodged particles proximateto said sample probe through said sampling port and into said particleanalyzer via said flow path; directing matter, energy or a combinationthereof at said surface from said ejection system to thereby dislodgeparticles from said surface; vacuuming said dislodged particles throughsaid sample port in said sample probe and into said particle analyzervia said flow path; and characterizing said dislodged particles usingsaid particle analyzer, thereby providing real-time detection of thedislodged particles.
 70. The method claim 69, wherein said step ofcharacterizing said dislodged particles comprises: detecting, sizing,and/or counting said dislodged particles; interacting a beam of a firstelectromagnetic radiation from said electromagnetic radiation sourcewith said dislodged particles, thereby causing said dislodged particlesto emit a second electromagnetic radiation; and detecting said secondelectromagnetic radiation emitted from said dislodged particles usingsaid electromagnetic radiation detector.
 71. The method of claim 69,wherein said characterizing step comprises determining a particleparameter selected from the group consisting of: number of particles;number of particles per unit surface area or particle concentration onthe surface; number of particles on the surface; particle cleaningefficacy; particle size; histogram of particle sizes; electromagneticradiation emitted from said dislodged particles; and any combinationthereof.